The following information was submitted:
Transactions: INTERNATIONAL JOURNAL of SYSTEMS ENGINEERING, APPLICATIONS AND DEVELOPMENT
Transactions ID Number: 20-680
Full Name: Vladimir Shepov
Position: Doctor (Researcher)
Age: ON
Sex: Male
Address: Akademgorodok 50, Krasnoyarsk
Country: RUSSIA
Tel: 2905494
Tel prefix: 391
Fax:
E-mail address: shepov@ksc.krasn.ru
Other E-mails: bob@iph.krasn.ru
Title of the Paper: Automatic device for measuring minority carrier lifetime in multicrystalline and monocrystalline silicon using noncontact microwave method.
Authors as they appear in the Paper: Vladimirov V.M., Konnov V.G., Markov V.V., Repin N.S., Shepov V.N.
Email addresses of all the authors: vlad@ksc.krasn.ru,shepov@ksc.krasn.ru,bob@iph.krasn.ru
Number of paper pages: 8
Abstract: An automatic device for minority carrier lifetime measurements in multicrystalline and monocrystalline silicon by noncontact microwave method has been developed. To increase the accuracy of the minority carrier lifetime measurements a microwave module has been designed. To extend the resistivity range of the silicon samples measured a microwave sensor has been developed. The application results of this device for noncontact measurements of the minority carrier lifetime in monocrystalline and polycrystalline silicon is presented.
Keywords: Microwave sensors; Elemental semiconductors; Microwave devices; Microwave measurements; Non-contact method.
EXTENSION of the file: .doc
Special (Invited) Session: Semiconductor Minority Carrier Lifetime Meter Using Noncontact Microwave Method "TAUMETER – 2M".
Organizer of the Session: 653-310
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