The following information was submitted:
Transactions: WSEAS TRANSACTIONS ON CIRCUITS AND SYSTEMS
Transactions ID Number: 53-800
Full Name: Petr Neumann
Position: Assistant Professor
Age: ON
Sex: Male
Address: Tomas Bata University in Zlin, nam.T.G.Masaryka 5555, 76001 Zlin
Country: CZECH REPUBLIC
Tel: +420-57603-5252
Tel prefix: +420-57603-
Fax: +420-576035279
E-mail address: neumann@fai.utb.cz
Other E-mails: pneu13@seznam.cz
Title of the Paper: The Counterfeit Components V-I Characteristics Difference Study
Authors as they appear in the Paper: Petr Neumann, Milan Adamek, Petr Skocik
Email addresses of all the authors: neumann@fai.utb.cz,adamek@fai.utb.cz,skocik@fai.utb.cz
Number of paper pages: 13
Abstract: The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. That voltage varies between two safe, for the component health limits, during the V-I characteristic recording. The applied voltage variation follows a certain function like sinus or ramp. The V-I characteristics of an individual component type can differ according to production technology, according to a particular manufacturer, or according to measurement conditions itself. Those so called natural differences can be registered by the study of statistically significant component population with known origin and history, and they can be subsumed in the comparison master pin print. That comparison master pin print is subsequently used as a criterion for discovering differences caused by improper treatment, failure or by the counterfeiting process. The article illustrates a counterfeit detector application!
for comparative V-I characteristics analysis aimed at a relevant knowledge base development for particular production technologies and component types.
Keywords: Counterfeit component, Counterfeit detector, V-I characteristic, Scan profile, Pin print, Comparison criteria, Master component
EXTENSION of the file: .doc
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Organizer of the Session:
How Did you learn about congress: Counterfeit component detection by V-I characteristics comparison
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