Monday 16 February 2009

Wseas Transactions

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Transactions: WSEAS TRANSACTIONS ON ELECTRONICS
Transactions ID Number: 32-252
Full Name: Wei Liao
Position: Student
Age: ON
Sex: Female
Address: 5800 South Hongmei Road, Shanghai,China
Country: CHINA
Tel: +008613774250680
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E-mail address: tougao6699@126.com
Other E-mails: liaowei54@126.com
Title of the Paper: research on k-fault diagnosis and testability in analog circuit
Authors as they appear in the Paper: Wei Liao, Jingao Liu
Email addresses of all the authors: liaowei54@126.com,tougao6699@126.com
Number of paper pages: 10
Abstract: Fault diagnosis is very important for development and maintenance of safe and reliable electronic circuits and systems. Many k-fault diagnosis methods were put forward such as branch method, node method, loop method, mesh method, cut set method. But the tolerance effect as well as non-linear problems exist and are difficult to deal with. A fault diagnosis method for analog circuit is proposed in this paper, including the mathematical model and two improved algorithms about K-node method and K-branch method. The potential of the algorithms is demonstrated by an order active circuit example and the workload of the verification can be reduced. For the testability problems of analog circuit, testability analysis and testability design are researched under prescriptive condition. A testable topological condition which has nothing to do with the circuit parameters is put forward, and the testability analysis and testability design are carried out by a variety of convenie!
nt and flexible ways. The method is extended to the testability problems of analog circuit, and result shows that the testability problems of analog circuit can be resolved effectively without any other complex numerical computation.
Keywords: K-fault diagnosis;Fault diagnosis;Fault verification;Analog circuit;K-node method£»K-branch method;Testability;
EXTENSION of the file: .doc
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