The following information was submitted:
Transactions: INTERNATIONAL JOURNAL of ENERGY and ENVIRONMENT
Transactions ID Number: 20-480
Full Name: Rizescu Cristiana-Zizi
Position: Ph.D. Candidate
Age: ON
Sex: Female
Address: Bd.Carol I, Nr.2,cod 130010
Country: ROMANIA
Tel:
Tel prefix:
Fax:
E-mail address: rizescu_c@yahoo.com
Other E-mails:
Title of the Paper: Heavy metals trace element analysis by X-Ray fluorescence (XRF) spectrometry in eaf dust
Authors as they appear in the Paper: Cristiana-Zizi Rizescu, Zorica Bacinschi, Elena Valentina Stoian, Aurora Anca Poinescu, Dan Nicolae Ungureanu, Cristi Petre Fluieraru
Email addresses of all the authors: rizescu_c@yahoo.com,valicirstea@yahoo.com,gminim2011@gmail.com,danungureanu2002@yahoo.com,cristi2006tgv@yahoo.com
Number of paper pages: 9
Abstract: Analysis of heavy metals from dust electrofilter by X-ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry. XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength. By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated. EAF dust represents one of the most hazardous, since it contains heavy metals such as Zn, Fe, Cr, Cd and Pb. The goal of the present work is to characterise the waste through chemical analysis by X-ray fluorescence spectroscopy ( XRF). Modern XRF instruments are capable of analyzing solid, liquid, and thin-film samples for both major and trace (ppm-level) components. The analysis is rapid and usually sample preparation is minimal. Axios-Metals performs even the most demanding XRF applications; from high-precision!
metals analysis to accurate trace element determination. Sensitive, reproducible and stable, it provides consistent high quality data across the full elemental range, from fluorine to uranium and from ppm to 100 wt%. XRF instruments are valuable tools here, from measuring traces for environmental reasons to the analysis of heavy metals in dust electrofilter to ensure environmental control. Elemental analysis using XRF is well established in the metals industry. Now, PANalytical's Axios-Metals wavelength-dispersive XRF spectrometer provides a powerful analytical solution, specifically for the steel and metals sectors.
Keywords: environmental control, heavy metals, dust electrofilter, steel and metals sectors, X- ray fluorescence (XRF) spectrometry
EXTENSION of the file: .doc
Special (Invited) Session: Heavy Metals Hazardous Components
Organizer of the Session: ID 650-636
How Did you learn about congress:
IP ADDRESS: 193.226.18.213